New MAHR MARSURF XC 20 MIT PCV 200 | Measuring Machines

Description

This finely tuned device configuration offers superb performance standards
The drive unit and measuring stand are controlled and positioned via the measuring and evaluation software
User prompts can be displayed
Interactive control elements support evaluations and automatic routines
Measurement of upper and lower contours with a twin stylus probe
- Relative evaluation of the two contours is made possible
Profile section images with evaluation of different parameters for each section
Segmented measurement is possible across obstacles such as bores or steep sides
Import and export of DXF files supported for setpoint/actual value comparison
PCV 200 drive unit with patented probe arm magnetic attachment for reproducible probe arm change
Patented probe system for measuring station flexibility
Manually variable tracing forces support flexibility
Synthetic creation of nominal profiles from straight lines and circle arcs
Easy comparison of nominal and actual profiles
- Different tolerances can be selected by description within a profile