New MAHR MARSURF XR 20 MIT GD 25 | Measuring Machines

Description

PC based instrument delivers all common surface parameters and profiles in accordance with international standards (both in measuring room and in production)
• Combines decades of experience in surface metrology with innovative technology
- Easy to read icons
- User friendly operator assistance
Over 100 surface parameters available for R-, P- and W-profiles in accordance with ISO / JIS, ASME or MOTIF (ISO 12085)
Tolerance monitoring and statistics for all surface parameters
Teach-in methods for the rapid creation of Quick&Easy measuring programs
Comprehensive measuring records
Automatic functions for choosing filter and traversing length in accordance with standards
Support for various calibration methods (static/dynamic) by specifying the Ra or Rz parameter
Adjustable maintenance and calibration intervals
Simulation mode for rapid familiarization with operating principle
Multiple measuring station configurations for custom applications