New MAHR MARSURF XC 2 MIT CD 120 | Measuring Machines

Description

The quick, simple and inexpensive 2D contour measuring system satisfies all demands in terms of accuracy and range of evaluation criteria
Consistently delivers safe and reliable results
Pparameters that are dependent on datum elements are recalculated as soon as a datum element is changed
Password protected user access prevents improper use
Outstanding calibration processes including geometry calibration, measuring force calibration, bend compensation, etc.
Sturdy, rigid probes
Smooth running, sturdy and accurate drive unit
Automatic lowering and raising of the probe arm at individually adjustable speeds
Patented probe arm attachement for collision protection